The Thermo Scientific™ Nexsa G2™ XPS System offers fully automated multi-technique analysis along with high throughput without sacrificing research grade results. Integration of multiple analytical techniques like ISS, UPS, REELS and Raman, allows users to conduct true correlative analysis, unlocking the potential for further advances in microelectronics, ultra thin films, nanotechnology development and many other applications.

Material Analysis and Development

The Nexsa G2 spectrometer delivers flexibility to maximize the potential of your material. Flexibility in the forms of multiple-integrated technique options for true correlative data analysis and high throughput while maintaining research quality results.

Product Features

Insulator Analysis
High Performance Spectroscopy
Depth Profiling
Multi-technique Integration
Dual-mode ion source for expanded depth profiling capabilities
Tilt Module for ARXPS measurements
Avantage Software for for instrument control, data processing, and reporting
Small spot analysis

Applications

Glass coatings
Polymers
Batteries
Graphene
Solar cells
OLEDs
Metals & oxides
Bio-surfaces
Thin Films
Semiconductors
Ceramics
Catalysts
Nanomaterials

Optional Upgrades

RAMAN: Spectroscopic technique used to in chemistry to provide a structural fingerprint
ISS: Ion scattering spectroscopy is a technique in which a beam of ions is scattered by a surface
UPS: Ultra-violet photoelectron spectroscopy refers to the measurement of kinetic energy spectra of photoelectrons emitted by molecules which have absorbed ultraviolet photons, in order to determine molecular orbital energies in the valence region
REELS: Reflected electron energy loss spectroscopy provides information on electronic structure and can measure the presence of hydrogen
NX Heater: Fully software controlled sample heating, enabling temperature dependent experiments

SnapMap

Bring sample features into focus with SnapMap's optical view. The optical view helps you pinpoint areas of interest quickly while developing a fully focused XPS image to further define your experiment.

Specifications

Item Description: Thermo Scientific Nexsa is a fully integrated XPS instrument, with optional additional analysis capabilities
X-ray Source Type: Monochromated, micro-focused, low power Al K-alpha X-ray source
X-ray spot size: 10 - 400 µm (adjustable in 5 µm steps)
Analyzer Type: 180°, double-focusing, hemispherical analyser with 128-channel detector
Sampling Area: 3600 mm²
Maximum sample thickness: 20 mm
Depth profiling: EX06 monatomic ion source or MAGCIS dual mode ion source
Optional Accessories: UPS, ISS, REELS, iXR Raman spectrometer, MAGCIS, sample tilt module, sample bias module, vacuum transfer module, adaptor for glove box integration, NX sample heater
Vacuum System: 2 x 260 l.s^-1 turbo molecular pumps, with automated titanium sublimation pump, and backing pump