Complete Surface Analysis Software

XPS Simplified

Realize the full potential of your electron spectrometer with the Thermo Scientific™ Avantage Software for surface analysis. This best-in-class data system integrates instrument control, data acquisition, data processing and reporting to provide precise, accurate and reliable instrument control.

Whether working in a dedicated research lab or as a tool in a multi-user environment, users of all abilities can rely on the flexibility, feature-set, and intuitive operation of the Avantage software to obtain the maximum information from their samples.

The critical component of a modern XPS instrument is its data system, orchestrating all aspects of operation, data reduction, and reportage.

All Thermo Scientific™ XPS systems use the Avantage™ software for instrument control, data processing, and reporting. Whether working in a dedicated research lab or as a tool in a multi-user environment, users of all abilities can rely on the flexibility, feature-set, and intuitive operation of Avantage to enable to obtain the maximum information from their samples.

Full system control, calibration and traceability

From the moment your samples loads, Avantage handles all the instrument operations to prepare for data collection.

Avantage monitors all system parameters, storing the data to keep a record of the performance of the instrument.

Avantage automatically calibrates important system components, so that crucial factors, such as the accuracy of the energy scale, are known and logged over time.

Data Acquisition

Avantage removes the barriers to getting the best possible data from your samples. Whether performing standard point analyses, collecting XPS images, or depth profiling, Avantage guides the operator to seamlessly build up the correct experimental protocol. Users can tailor the experiment parameters to their specific needs, and store commonly used set-ups in libraries to facilitate common experiments.

Sensible default parameters, intelligent scan optimisation, and automated analysis routines even allow the system to make decisions during acquisition to progress through the analysis process all the way through to publishing a report.

Experiment Tree

The centre of the acquisition process is the experiment tree. This is where experiments are built-up using simple, modular components.

Automatic Identification

Intelligent spectral interpretation algorithms can assess your data to quantify the elemental composition, and assess the likely chemical states present at the surface.

Knowledge Viewer

The Avantage Knowledge Viewer contains a store of XPS information to offer advice on experimental considerations, and spectral interpretation. The Knowledge Viewer links to a database of spectra, which can be opened in Avantage, and used to help with peak fitting and chemical state quantification.

Data analysis

Move at speed from data to results, with the comprehensive selection of processing tools in Avantage.

Including essential features to quantify individual spectra and powerful peak deconvolution routines, Avantage enables the user to get the key chemical information from their samples with ease.

Peak Deconvolution

In order to quantify chemical states from overlapping peaks it is necessary to fit the data with synthetic peak shapes. Avantage allows control of background shapes, peak shapes, and fitting algorithms to ensure that results are as accurate as possible. Linked doublets can be added with a single button press to use a known component to define the related peak that overlaps with another.

Elemental and Chemical State Imaging

Rich imaging datasets created where each pixel corresponds to an array of spectra, need advanced tools to extract the complete picture. Avantage has everything required to create elemental and chemical state images, create phase analyses, and extract spectra from small features.

Retrospective spectroscopy

Select areas of interest on an XPS image.

Avantage averages the spectra from each pixel and display the results for each region or element. Spectra from features as small below 7 µm in size can be viewed in this way from ESCALAB Xi+ parallel images.

Component & Phase Analysis

Image data can be analyzed using principal component analysis to extract spectral components for fitting chemical states, or to identify phases on the surface. Phase analysis creates images with elemental or chemical state quantification and average spectra of each phase, ideal for reporting the results of XPS image analysis.

Data profiles

XPS plays a key role in understanding layer chemistries. Whether using a standard ion gun or the advanced MAGCIS™ source to collect sputter depth profiles, or collecting angle-resolved XPS data, Avantage collects and processes the data. Profiles can be displayed in real-time--as they are collected-- and processed to gain ultimate understanding of thin and ultra-thin films.

Depth Profiles

Avantage allows depth profiles to be displayed during acquisition so that changes to sputter parameters can be made on-the-fly. Coupled with remote access to the instrument PC, this creates the ability to get every profile, even on unknown samples, right first time. Extensive tools to peak fit data accurately at every level of a profile, and correlate etch times to depths allow layer chemistries to be located and measured.

Angle-Resolved XPS

Whether using an ESCALAB Xi+, a K-Alpha or the Theta Probe’s parallel capability to collect ARXPS data, Avantage has all that is needed to extract the maximum information about ultra-thin films. Simple relative depth plots that determine layer ordering, and calculators that determine layer thicknesses are easy to use.

The ARProcess plug-in takes the data and uses advanced genetic algorithms to create composition profiles of an ultra-thin film stack.


From simple copy-and-paste of data into spreadsheet programs, to full reporting of datasets into customised templates, Avantage users can get their XPS answers quickly disseminated into reports, papers and presentations.