High performance surface analysis in a compact XPS System

Introduced in 2006, the Thermo Scientific™ K-Alpha™ XPS spectrometer brought a new approach to surface analysis. Focusing on delivering high quality results based on a streamlined workflow, the K-Alpha spectrometer made XPS operation simple and intuitive, with no sacrifice in terms of performance or XPS capabilities. The K-Alpha gave more and more researchers access to surface analysis.

Now, the Thermo Scientific™ K-Alpha™ X-ray Photoelectron Spectrometer (XPS) System updates the core XPS performance with faster data acquisition, better detectability, and easier chemical state resolution. Exciting new hardware capabilities such as XPS SnapMap are integrated with new software features such as eSP and KnowledgeView to assist in spectral interpretation.

State-of-the-art performance, reduced cost of ownership, increased ease of use and high sample throughput makes the K-Alpha X-ray XPS System ideal for a multi-user environment.

Application Areas

Key Features and Benefits of the K-Alpha

High Performance XPS Spectroscopy

Developments in monochromator and electron analyser systems allow the K-Alpha to greatly improve on the XPS performance of the original K-Alpha. The new X-ray monochromator allows you to select an analysis area from 50 µm to 400 µm in 5 µm steps. The analysis area is tuned to the feature of interest to maximize the signal. The high efficiency electron lens, hemispherical analyzer and detector allow for superb detectability, and rapid data acquisition.

Insulator Analysis

Charge compensation makes insulator analysis as easy as working with any other sample. Our patented dual-beam flood source couples low energy ion beams with very low energy electrons (less than 1 eV), which prevents sample charging during analysis. This eliminates the need, in most cases, for charge referencing — making the analysis of the data from insulating samples as easy as collecting the data.

XPS SnapMap

XPS SnapMap integrates with the patented K-Alpha reflex optics system to add rapid XPS imaging for feature alignment and identification. XPS SnapMap can generate images over a few mm2 in a fraction of the time required for a full map, making it ideal for quickly identifying areas for analysis that cannot be easily seen using the optical view. XPS SnapMap is also available to use within experiments, for fast, quantitative spectroscopic imaging.

Chemical State Imaging

The K-Alpha creates chemical state images of the surface. Useful in analyzing small sample features, but capable of imaging a large sample the size of the whole sample stage. The unique optical viewing system offers the opportunity to overlay XPS images with stored camera images, creating powerful tool for identifying and quantifying distributions of surface chemistries.

Depth Profiling

The K-Alpha is built to go beyond the surface with a standard ion source or MAGCIS, the optional dual mode monatomic and gas cluster ion source. Automated source optimization and automated gas handling ensures excellent performance and experimental reproducibility.

Precise results – Quickly and Efficiently

The K-Alpha bridges the XPS requirements for both research and routine analysis with cutting-edge performance and advanced XPS capabilities. Intuitive operation—guided by the Avantage data system—makes the K-Alpha ideal for both multi-user, shared facilities, as well as XPS experts who place a premium on efficient operation and high throughput analyses.

Three cameras provide easy sample navigation and precision sample alignment. The unique optically driven user experience minimizes the learning curve, and maximizes productivity.

Supplied with standards necessary for calibration, which are permanently mounted with the analysis chamber, the K-Alpha self-calibrates in minutes with a single button press. This assures the utmost confidence in the quality of your data.

Analyzing Solid-state and Thin Film Materials Using XPS


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