X-Ray Photoelectron Spectroscopy

X-ray photoelectron spectroscopy (XPS) is a powerful analytical technique used to examine the surface of materials, providing valuable insights into both elemental and chemical composition. XPS is extremely surface sensitive — it measures approximately the top 10 nanometers of the surface of the sample. This surface specificity, combined with the ability to quantify the chemical composition of the surface, makes XPS extremely useful for materials analysis.

Whether you are new to XPS or seeking advanced knowledge, we can help you understand the technique, its applications, and its significance in various scientific disciplines.