XPS is useful for investigating almost all surface problems. Below are examples of how XPS data can be used to solve problems with existing surface interactions, or to investigate new materials. Click on a link to download the corresponding application note PDF.
Biological
- Analysis of a Wound Dressing
- Characterization of Chemical Gradients and Antibody Immobilization Using XPS and ARXPS
- XPS Surface Characterization of Disposable Laboratory Gloves and the Transfer of Glove Components to Other Surfaces
Catalysis
- Investigating the Oxidation of a Cobalt-based Catalyst Using X-ray Photoelectron Spectroscopy
- Surface Chemical-State Analysis of Metal Oxide Catalysts
Defect Analysis
- Fast, Effective XPS Point Analysis of Metal Components
- Adhesion Failure Analysis
- XPS Investigation of Printed Paper
- Mapping of the Work Function of a Damaged Solar Cell
- XPS Analysis of a Surface Contamination on a Steel Sample
- XPS Analysis of Defects on a Painted Surface
- XPS Surface Characterization of Disposable Laboratory Gloves and the Transfer of Glove Components to Other Surfaces
- Characterization of High-k Dielectric Materials on Silicone using Angle Resolved XPS
- Characterization of Silicon Oxide and Oxynitride Layers
Glass Coatings
- Analyzing Contact Lens Samples
- Characterization of Low-Emissivity Glass Coatings using X-ray Photoelectron Spectroscopy
Microelectronics
- Angle Resolved XPS Analysis for the Characterization of Self Assembled Monolayers
- Characterization of high-k dielectric materials on silicon using Angle Resolved XPS
- Characterization of Silicon Oxide and Oxynitride Layers
- Compositional XPS Analysis of a Cu(In,Ga)Se2 Solar Cell
- XPS Analysis of a Dry Film Photo-Resist
- XPS Characterization of Thin Gold Layers on Steel Separators for Fuel Cell Applications
- Multitechnique Surface Characterization of Organic LED Material
- Parallel Angle Resolved X-ray Photoelectron Spectroscopy (ARXPS) Mapping of Ultra Thin SiO2 on Si
- Parallel Angle-Resolved XPS Analysis of Self Assembled Monolayer
- Spectroscopic Analysis of Solid Oxide Fuel Cell Material with XPS
- Sub-micron X-ray Photoelectron Imaging
- The Karlsruhe Micro Nose, KAMINA
- XPS Analysis of a Hard Disk Platter by Rapid Depth Profiling
- XPS Characterization of 'Click' Surface Chemistry
- XPS Characterization of Membrane Electrode Assembly from Proton Exchange Fuel Cell
Oxides
- Hydrogen Quantification using the ESCALAB Xi+
- Investigating the Oxidation of a Cobalt-based Catalyst Using X-ray Photoelectron Spectroscopy
- Spectroscopic Analysis of Solid Oxide Fuel Cell Material with XPS
- XPS Analysis of a Surface Contamination on a Steel Sample
- XPS Analysis of Stainless Steel Surfaces
- XPS Identification of Stains on Split Steel Bearings
Polymers
- Imaging the Chemistry of a Plasma Modified Polymer Surface Using XPS
- Chemical State Mapping of Polymers
- Using X-ray Photoelectron Spectroscopy to Investigate the Surface Treatment of Fabrics
- XPS Analysis of a Dry Film Photo-Resist
Routine Analysis
- XPS Analysis of Stainless Steel Surfaces
- XPS Identification of Stains on Split Steel Bearings
- Compositional XPS Analysis of a Cu(In,Ga)Se2 Solar Cell
- Mapping of the Work Function of a Damaged Solar Cell
- XPS Characterization of Thin Gold Layers on Steel Separators for Fuel Cell Applications
- The Karlsruhe micro nose, KAMINA
- Using X-ray Photoelectron Spectroscopy to Investigate the Surface Treatment of Fabrics
- XPS Analysis of a Hard Disk Platter by Rapid Depth Profiling
- XPS Characterization of 'Click' Surface Chemistry
- Fast, Effective XPS Point Analysis of Metal Components