Analytics

Nexsa – XPS System

New fully automated multi-technique surface analysis system


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XPS Instrumentation MAGCIS Dual Ion Beam Contact

XPS Instrumentation

Learn how our portfolio of XPS systems fit the demanding requirements in your analytical lab.

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MAGCIS Dual Ion Beam

Dual ion source for monatomic and gas cluster depth profiling and sample cleaning.

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Stay up to date on the latest developments in XPS instrumentation, webinars and application materials.

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XPS Applications What Is XPS? Elements Table

XPS Applications

Download literature from our large library of surface analysis application notes.

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Learn XPS

Collect information from the top 1–10nm of materials from metals to polymers to organic thin films.

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Elements Table

Explore our information-packed Knowledge Base of elemental properties and XPS analysis.

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